Title :
Design of timing-error-resilient systolic arrays for matrix multiplication
Author :
Chi, Hsin-Chou ; Tseng, Hsi-Che ; Tsai, Kun-Lin
Abstract :
With semiconductor technology scaling, the size of transistors and their operating voltage keep decreasing. One of the major problems with advanced semiconductor technology is timing errors caused by process variation and noises. With such problem, conventional worst-case designs suffer poor system performance. This paper proposes aggressive designs of systolic arrays for matrix multiplication which can tolerate timing errors. When timing errors occur, the system reconfigures the computing cells with little performance degradation. Our implementation results show that our proposed designs achieve tolerance of timing errors with reasonable cost.
Keywords :
integrated circuit design; logic design; matrix multiplication; semiconductor technology; systolic arrays; matrix multiplication; operating voltage; semiconductor technology scaling; systolic array design; timing-error-resilient systolic array; transistors size; VLSI design; error-resilient design; systolic arrays; timing errors;
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
DOI :
10.1109/ISOCC.2011.6138749