DocumentCode :
3146834
Title :
Classes of Diagnostic Tests
Author :
Paulson, Charles
Author_Institution :
Department of Computer Science, Stanford University, Stanford, CA
fYear :
1983
fDate :
27-29 June 1983
Firstpage :
316
Lastpage :
322
Abstract :
This paper presents the results of an investigation into the types of tests useful for automatically diagnosing combinational digital devices. The diagnosis is based on a design model that allows hierarchy in both the structure and the data of the device being represented. A more general set of assumptions than is commonly employed allows data values other than boolean values to be diagnosed, and permits faults other than stuck-at faults to be found. The design model, the assumptions, and the tests are represented in SUBTLE, a language based on predicate calculus and specialized for digital systems.
Keywords :
Automatic testing; Calculus; Circuit faults; Circuit testing; Computer science; Digital systems; Fault diagnosis; Logic testing; Sequential analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1983. 20th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0026-8
Type :
conf
DOI :
10.1109/DAC.1983.1585668
Filename :
1585668
Link To Document :
بازگشت