DocumentCode
3146834
Title
Classes of Diagnostic Tests
Author
Paulson, Charles
Author_Institution
Department of Computer Science, Stanford University, Stanford, CA
fYear
1983
fDate
27-29 June 1983
Firstpage
316
Lastpage
322
Abstract
This paper presents the results of an investigation into the types of tests useful for automatically diagnosing combinational digital devices. The diagnosis is based on a design model that allows hierarchy in both the structure and the data of the device being represented. A more general set of assumptions than is commonly employed allows data values other than boolean values to be diagnosed, and permits faults other than stuck-at faults to be found. The design model, the assumptions, and the tests are represented in SUBTLE, a language based on predicate calculus and specialized for digital systems.
Keywords
Automatic testing; Calculus; Circuit faults; Circuit testing; Computer science; Digital systems; Fault diagnosis; Logic testing; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1983. 20th Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0026-8
Type
conf
DOI
10.1109/DAC.1983.1585668
Filename
1585668
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