• DocumentCode
    3146834
  • Title

    Classes of Diagnostic Tests

  • Author

    Paulson, Charles

  • Author_Institution
    Department of Computer Science, Stanford University, Stanford, CA
  • fYear
    1983
  • fDate
    27-29 June 1983
  • Firstpage
    316
  • Lastpage
    322
  • Abstract
    This paper presents the results of an investigation into the types of tests useful for automatically diagnosing combinational digital devices. The diagnosis is based on a design model that allows hierarchy in both the structure and the data of the device being represented. A more general set of assumptions than is commonly employed allows data values other than boolean values to be diagnosed, and permits faults other than stuck-at faults to be found. The design model, the assumptions, and the tests are represented in SUBTLE, a language based on predicate calculus and specialized for digital systems.
  • Keywords
    Automatic testing; Calculus; Circuit faults; Circuit testing; Computer science; Digital systems; Fault diagnosis; Logic testing; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1983. 20th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0026-8
  • Type

    conf

  • DOI
    10.1109/DAC.1983.1585668
  • Filename
    1585668