Title : 
Hierarchical Circuit Extraction with Detailed Parasitic Capacitance
         
        
            Author : 
Tarolli, Gary M. ; Herman, William J.
         
        
            Author_Institution : 
Digital Equipment Corporation, Hudson, MA
         
        
        
        
        
        
            Abstract : 
This paper describes a hierarchical MOS layout verification program called IV. IV extracts a circuit netlist from a MOS layout and then compares this netlist to a reference circuit netlist obtained from a schematic. The circuit extraction phase of IV is described in detail. A unique characteristic of the program is the treatment of parasitic capacitance. IV is currently being used in a production environment to extract circuits in a variety of NMOS and CMOS processes.
         
        
            Keywords : 
CMOS process; Data mining; Data structures; Geometry; Integrated circuit interconnections; MOS devices; Parasitic capacitance; Production; Very large scale integration; Voice mail;
         
        
        
        
            Conference_Titel : 
Design Automation, 1983. 20th Conference on
         
        
        
            Print_ISBN : 
0-8186-0026-8
         
        
        
            DOI : 
10.1109/DAC.1983.1585671