DocumentCode :
3147021
Title :
Comparison of cross-tour traveling service satisfaction: A correspondence-cluster graphical representation of doubled data matrix
Author :
Tseng, Shun-Yao ; Yang, Chyan
Author_Institution :
Dept. of Int. Trade, Coll. of Hsing Wu, Taipei
fYear :
2008
fDate :
21-24 Sept. 2008
Firstpage :
940
Lastpage :
945
Abstract :
The correspondence analysis and correspondence cluster analysis are useful and can be more clear and practical in the field of travel satisfaction research for the case of categorical criteria values. We demonstrate this claim by performing three tasks: (1) to transform the Likert scaling data matrix to binary data matrix, then double the binary data matrix, (2) the complementary use of correspondence analysis and (3) correspondence cluster analysis will be performed on the doubled binary data matrix. A simultaneous graphical representation of the relationship between multi-tour and service quality can be obtained. This diagram, the correspondence cluster dendrogram, is helpful to the decision maker in understanding the competitive advantage of different tours and in improving their travel service quality.
Keywords :
customer satisfaction; customer services; decision making; statistical analysis; travel industry; Likert scaling data matrix; correspondence cluster analysis; correspondence-cluster graphical representation; decision making; doubled binary data matrix; service quality; traveling service satisfaction; Analysis of variance; Business communication; Data analysis; Displays; Educational institutions; Graphics; International trade; Performance analysis; Sociology; Travel services; Correspondence Analysis; Correspondence Cluster Analysis; Doubled data matrix;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology, 2008. ICMIT 2008. 4th IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-2329-3
Electronic_ISBN :
978-1-4244-2330-9
Type :
conf
DOI :
10.1109/ICMIT.2008.4654493
Filename :
4654493
Link To Document :
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