Title :
HEMP coupling to circuits inside the shielding box with a penetrative wire
Author :
Tongbin, Yu ; Bihua, Zhou
Author_Institution :
EMP Lab., Nanjing Eng. Inst., China
Abstract :
HEMP coupling to circuits inside the shielding box with a penetrative wire is studied using the FDTD method. Results show that a penetrative wire can make the HEMP induced current in circuits inside the shielding box increase greatly through coupling with the incident field and the scattering field of the shielding box. This is useful for estimating the HEMP coupling to electronic apparatus and systems such as radios and computers.
Keywords :
electric current; electromagnetic coupling; electromagnetic pulse; electromagnetic shielding; finite difference time-domain analysis; FDTD method; HEMP coupling; electromagnetic susceptibility; electronic apparatus; high-altitude EMP coupling; incident field; induced current; penetrative wire; scattering field; shielding box; Apertures; Coupling circuits; EMP radiation effects; Electromagnetic coupling; Finite difference methods; Magnetic fields; Solid modeling; Surface resistance; Time domain analysis; Wire;
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
DOI :
10.1109/ELMAGC.2002.1177378
