DocumentCode
3147031
Title
HEMP coupling to circuits inside the shielding box with a penetrative wire
Author
Tongbin, Yu ; Bihua, Zhou
Author_Institution
EMP Lab., Nanjing Eng. Inst., China
fYear
2002
fDate
21-24 May 2002
Firstpage
111
Lastpage
114
Abstract
HEMP coupling to circuits inside the shielding box with a penetrative wire is studied using the FDTD method. Results show that a penetrative wire can make the HEMP induced current in circuits inside the shielding box increase greatly through coupling with the incident field and the scattering field of the shielding box. This is useful for estimating the HEMP coupling to electronic apparatus and systems such as radios and computers.
Keywords
electric current; electromagnetic coupling; electromagnetic pulse; electromagnetic shielding; finite difference time-domain analysis; FDTD method; HEMP coupling; electromagnetic susceptibility; electronic apparatus; high-altitude EMP coupling; incident field; induced current; penetrative wire; scattering field; shielding box; Apertures; Coupling circuits; EMP radiation effects; Electromagnetic coupling; Finite difference methods; Magnetic fields; Solid modeling; Surface resistance; Time domain analysis; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN
0-7803-7277-8
Type
conf
DOI
10.1109/ELMAGC.2002.1177378
Filename
1177378
Link To Document