Title :
Identifying the main nonlinear contributions: use of multisine excitations during circuit design
Author :
De Locht, Ludwig ; Vandersteen, Gerd ; Wambacq, Piet ; Rolain, Yves ; Pintelon, Rik ; Schoukens, Johan ; Donnay, Stéphane
Author_Institution :
Wireless Res., IMEC, Heverlee, Belgium
Abstract :
Modeling and understanding the nonlinear behavior of analog and RF circuits is essential for good design of telecommunication systems. Classical Volterra series give the designer this necessary insight, but they are only valid for weakly nonlinear systems and they are difficult to edit. To overcome these limitations, we developed a technique to identify, quantify and qualify the sources of nonlinear behavior in analog and RF circuits by combining the information obtained by a set of simulations that use periodic excitation signals with a given power spectrum and arbitrary phases. The paper describes and demonstrates this approach by the analysis of the cascade of a BiCMOS power preamplifier and power amplifier with adaptive biasing for 5 GHz wireless local area networks (WLAN). The approach is applicable to weakly and strongly nonlinear systems, which is demonstrated by pushing the amplifier into compression. Furthermore, it provides useful design information, such as the contribution of each subcircuit to the overall nonlinear behavior.
Keywords :
BiCMOS analogue integrated circuits; analogue circuits; microwave power amplifiers; nonlinear distortion; nonlinear network analysis; nonlinear network synthesis; preamplifiers; radio equipment; wireless LAN; 5 GHz; BiCMOS power amplifier; BiCMOS power preamplifier; RF circuits; Volterra series; WLAN; adaptive biasing; analog circuits; circuit analysis; circuit design; multisine excitations; nonlinear contributions; periodic excitation signals; wireless LAN; wireless local area networks; BiCMOS integrated circuits; Circuit simulation; Circuit synthesis; Nonlinear systems; Preamplifiers; RF signals; Radio frequency; Radiofrequency identification; Signal processing; Wireless LAN;
Conference_Titel :
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Print_ISBN :
0-7803-8952-2
DOI :
10.1109/ARFTGF.2004.1427574