Title :
Applicability of F-value to Classification Problems with a Numerous Number of Explanatory Variables: Toward Classification Problems in Biometric and Kansei Engineering
Author :
Nagashima, Tomomasa ; Wang, Xinping ; Okada, Yoshifumi ; Sawai, Masahiro
Author_Institution :
Dept. of Comput. Sci. & Syst. Technol., Muroran Inst. of Technol., Muroran, Japan
Abstract :
F-value is a statistics which estimates a significance of variables participating discriminant efficiency. It has been used in statistical discriminant analysis. However, it seems a few investigations on real problems which must cope with a numerous number of explanatory variables amount to tens of thousands. In such cases, it becomes important to extract useful variables for classification from a numerous number of variables, because we do not know in advance which variables make significant contribution.
Keywords :
biometrics (access control); data analysis; pattern classification; statistical analysis; F-value; Kansei engineering; biometrics; classification problem; explanatory variables; statistical discriminant analysis; variable significance; Biometrics; Computer science; Feature extraction; Laboratories; Pattern analysis; Pattern recognition; Prediction algorithms; Satellites; Statistics; Testing; F-value; discriminant analysis; explanatory variable; gene expression; power spectrum;
Conference_Titel :
Biometrics and Kansei Engineering, 2009. ICBAKE 2009. International Conference on
Conference_Location :
Cieszyn
Print_ISBN :
978-0-7695-3692-7
Electronic_ISBN :
978-0-7695-3692-7
DOI :
10.1109/ICBAKE.2009.45