Title :
Silicon photo-multiplier radiation hardness tests with a white neutron beam
Author :
Andreotti, Marcus ; Baldini, W. ; Calabrese, R. ; Cibinetto, G. ; De Donato, C. ; Luppi, E. ; Pietropaolo, Andrea ; Cotta Ramusino, A. ; Malaguti, R. ; Montanari, Alessandro ; Reali, E. ; Santoro, Vincenzo ; Tellarini, G. ; Tomassetti, L. ; Tosi, Niccolo
Author_Institution :
Univ. di Ferrara & INFN, Ferrara, Italy
Abstract :
We report radiation hardness tests performed, with a white neutron beam, at the Geel Electron LINear Accelerator in Belgium on silicon Photo-Multipliers. These are semiconductor photon detectors made of a square matrix of Geiger-Mode Avalanche photo-diodes on a silicon substrate. Several samples from different manufacturers have been irradiated integrating up to about 6.2 × 109 1-MeV-equivalent neutrons per cm2.
Keywords :
avalanche photodiodes; photomultipliers; radiation hardening (electronics); silicon radiation detectors; Belgium; Geel Electron Linear Accelerator; Geiger-mode avalanche photodiode square matrix; semiconductor photon detectors; silicon photomultiplier radiation hardness tests; white neutron beam; Current measurement; Dark current; Detectors; Neutrons; Photonics; Radiation effects; Silicon; Silicon Photomultipliers; neutron damage; radiation hardness;
Conference_Titel :
Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), 2013 3rd International Conference on
Conference_Location :
Marseille
Print_ISBN :
978-1-4799-1046-5
DOI :
10.1109/ANIMMA.2013.6728033
