DocumentCode :
3147354
Title :
Compact thermal models: Assessment and pitfalls
Author :
Kung, Jaeha ; Shin, Youngsoo
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2011
fDate :
17-18 Nov. 2011
Firstpage :
337
Lastpage :
340
Abstract :
Thermal analysis involves solving a differential equation, thus inherently takes a long time. Any thermal optimization techniques require a compact model that can be evaluated fast while accuracy is not sacrificed too much. Several models have been proposed, but their accuracy and runtime have not been fully understood and compared. Three models, namely resistive network, heat diffusion measure, and thermal signature, are studied; a series of experiments reveals that thermal signature is clearly a model of choice. Power density is a key parameter in thermal analysis, and is usually given as a constant value, which corresponds to the average over the region a block occupies and over the time period it operates. The error as a result of approximation is often unnoticed; this is studied in a quantitative way for the first time.
Keywords :
differential equations; thermal analysis; compact model; compact thermal model; differential equation; heat diffusion measure; power density; resistive network; thermal analysis; thermal optimization; thermal signature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
Type :
conf
DOI :
10.1109/ISOCC.2011.6138779
Filename :
6138779
Link To Document :
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