DocumentCode
31478
Title
Sparse Bayesian Extreme Learning Machine for Multi-classification
Author
Jiahua Luo ; Chi-Man Vong ; Pak-Kin Wong
Author_Institution
Dept. of Comput. & Inf. Sci., Univ. of Macau, Macau, China
Volume
25
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
836
Lastpage
843
Abstract
Extreme learning machine (ELM) has become a popular topic in machine learning in recent years. ELM is a new kind of single-hidden layer feedforward neural network with an extremely low computational cost. ELM, however, has two evident drawbacks: 1) the output weights solved by Moore-Penrose generalized inverse is a least squares minimization issue, which easily suffers from overfitting and 2) the accuracy of ELM is drastically sensitive to the number of hidden neurons so that a large model is usually generated. This brief presents a sparse Bayesian approach for learning the output weights of ELM in classification. The new model, called Sparse Bayesian ELM (SBELM), can resolve these two drawbacks by estimating the marginal likelihood of network outputs and automatically pruning most of the redundant hidden neurons during learning phase, which results in an accurate and compact model. The proposed SBELM is evaluated on wide types of benchmark classification problems, which verifies that the accuracy of SBELM model is relatively insensitive to the number of hidden neurons; and hence a much more compact model is always produced as compared with other state-of-the-art neural network classifiers.
Keywords
belief networks; feedforward neural nets; learning (artificial intelligence); minimisation; pattern classification; ELM; Moore-Penrose generalized inverse; benchmark classification problem; hidden neurons; least squares minimization; machine learning; marginal likelihood estimation; redundant hidden neurons; single-hidden layer feedforward neural network; sparse Bayesian extreme learning machine; Accuracy; Bayes methods; Computational modeling; Couplings; Neurons; Support vector machines; Training; Bayesian learning; classification; extreme learning machine (ELM); sparsity;
fLanguage
English
Journal_Title
Neural Networks and Learning Systems, IEEE Transactions on
Publisher
ieee
ISSN
2162-237X
Type
jour
DOI
10.1109/TNNLS.2013.2281839
Filename
6615928
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