DocumentCode
3147888
Title
Examination of the risk of flash X-ray induced breakdown in pressurised electrical enclosures
Author
Pigneret, J.
Author_Institution
Nucletudes SA, Les Ulis, France
fYear
1991
fDate
9-12 Sep 1991
Firstpage
548
Lastpage
552
Abstract
Disruptive breakdown in gas triggered by flash X-rays is studied. For relevant electrode geometries found in electrical and electronic boxes, filled with air, nitrogen or SF6 under a pressure between 1 and 1000 millibars, is noticed a drop in the breakdown threshold voltage when the dose rate is higher than 1E8 rad (Si)/s. The maximum drop appears at about 1E10 rad (Si)/s but is never higher than half of the static BV. For higher dose rates (1E11-1E12) the breakdown voltage tends to increase, due to the higher charge density created in the gas, which precludes to the filament formation. The impact of solid dielectrics on the phenomena is evaluated, and a protection strategy is proposed
Keywords
X-ray effects; electric breakdown of gases; gaseous insulation; 1 to 1000 mbar; N2; SF6; air; breakdown threshold voltage; disruptive breakdown; dose rate; flash X-ray induced breakdown; gas breakdown; pressurised electrical enclosures; protection strategy; solid dielectrics; Breakdown voltage; Electric breakdown; Electrodes; Geometry; Nitrogen; Polarization; Protection; Solids; Sulfur hexafluoride; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location
La Grande-Motte
Print_ISBN
0-7803-0208-7
Type
conf
DOI
10.1109/RADECS.1991.213531
Filename
213531
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