• DocumentCode
    3147888
  • Title

    Examination of the risk of flash X-ray induced breakdown in pressurised electrical enclosures

  • Author

    Pigneret, J.

  • Author_Institution
    Nucletudes SA, Les Ulis, France
  • fYear
    1991
  • fDate
    9-12 Sep 1991
  • Firstpage
    548
  • Lastpage
    552
  • Abstract
    Disruptive breakdown in gas triggered by flash X-rays is studied. For relevant electrode geometries found in electrical and electronic boxes, filled with air, nitrogen or SF6 under a pressure between 1 and 1000 millibars, is noticed a drop in the breakdown threshold voltage when the dose rate is higher than 1E8 rad (Si)/s. The maximum drop appears at about 1E10 rad (Si)/s but is never higher than half of the static BV. For higher dose rates (1E11-1E12) the breakdown voltage tends to increase, due to the higher charge density created in the gas, which precludes to the filament formation. The impact of solid dielectrics on the phenomena is evaluated, and a protection strategy is proposed
  • Keywords
    X-ray effects; electric breakdown of gases; gaseous insulation; 1 to 1000 mbar; N2; SF6; air; breakdown threshold voltage; disruptive breakdown; dose rate; flash X-ray induced breakdown; gas breakdown; pressurised electrical enclosures; protection strategy; solid dielectrics; Breakdown voltage; Electric breakdown; Electrodes; Geometry; Nitrogen; Polarization; Protection; Solids; Sulfur hexafluoride; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
  • Conference_Location
    La Grande-Motte
  • Print_ISBN
    0-7803-0208-7
  • Type

    conf

  • DOI
    10.1109/RADECS.1991.213531
  • Filename
    213531