Title :
Heavy ion micro-beam near the Saclay booster irradiation facility
Author :
Patin, Y. ; Lochard, J.P.
Author_Institution :
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
Abstract :
A micro-diaphragm apparatus is being installed near the Van de Graaff tandem post-accelerator of Saclay. A micro-hole coupled with optical microscope enables one to locate the ion impact point on the sample. This facility will allow irradiations on a circular area of 5 to 10 microns diameter
Keywords :
ion accelerators; ion beam effects; test facilities; van de Graaff accelerators; Saclay booster irradiation facility; Van de Graaff tandem post-accelerator; heavy ion microbeam; ion impact point; micro-diaphragm apparatus; micro-hole; Acceleration; Cameras; Circuits; Ion accelerators; Optical microscopy; Optical sensors; Particle beam optics; Plasma accelerators; Plasma density; Resumes;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213532
