DocumentCode :
3147913
Title :
The UK5000 - Successful Collaborative Development of an Integrated Design System for a 5000 Gate CMOS Array with Built-In Test
Author :
Grierson, J.R. ; Cosgrove, B. ; Daniel, R. ; Halliwell, R.E. ; Kirk, I.H. ; Knight, J.C. ; McLean, J.A. ; McGrail, J.M. ; Newton, C.O.
Author_Institution :
British Telecom Research Labs., Martlesham Heath, Ipswich, UK
fYear :
1983
fDate :
27-29 June 1983
Firstpage :
629
Lastpage :
636
Abstract :
Following a UK Department of Industry initiative, the UK5000 project was launched in July 1981 on a 2 year timescale by 7 autonomous UK organizations with different computer systems. The activity involved the collaborative development of an integrated design system for a 5000 gate CMOS array. The DA system was to be portable and capable of generating layouts and test programs from logic circuit descriptions in a time of the order of one week. The CMOS array is unique in containing rows of dedicated bistables, preformed on chip into a shift loop for scan path testing with a totally synchronous clocking scheme. The dedicated bistables, clock lines, shift loops etc, together with the synchronous design lead to lower routeing requirements, elimination of timing hazards and excellent testability.
Keywords :
Built-in self-test; Circuit testing; Clocks; Collaboration; Computer industry; Hazards; Logic circuits; Logic testing; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1983. 20th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0026-8
Type :
conf
DOI :
10.1109/DAC.1983.1585721
Filename :
1585721
Link To Document :
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