Title :
On-chip microwave test circuits for production IC measurements
Author :
Eisenstadt, William R. ; Fox, Robert M. ; Yin, Qizhang ; Yoon, Jang-Sup ; Zhang, Tao
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
The paper presents recent progress in the development of embedded test for RF/microwave circuits. This work includes compact on-chip circuits designed for (1) microwave signal sampling (5 GHz couplers, baluns, and combiners), and (2) microwave/RF signal detection circuits (5 GHz peak detector and 1 GHz RMS detector).
Keywords :
UHF integrated circuits; baluns; built-in self test; directional couplers; microwave integrated circuits; peak detectors; signal detection; signal sampling; system-on-chip; 1 GHz; 5 GHz; RF circuits; RF signal detection; RMS detector; SoC; baluns; combiners; directional couplers; embedded test; microwave circuits; microwave signal detection; microwave signal sampling; on-chip microwave test circuits; peak detector; production IC measurements; Circuit testing; Couplers; Integrated circuit testing; Microwave circuits; Microwave integrated circuits; Microwave measurements; Production; Radio frequency; Signal design; Signal sampling;
Conference_Titel :
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Print_ISBN :
0-7803-8952-2
DOI :
10.1109/ARFTGF.2004.1427602
