• DocumentCode
    3148127
  • Title

    Test Strategy for Microprocessers

  • Author

    Jain, Sunil K. ; Susskind, Alfred K.

  • Author_Institution
    Dept. of Electrical and Computer Engineering, Lehigh University, Bethlehem, PA
  • fYear
    1983
  • fDate
    27-29 June 1983
  • Firstpage
    703
  • Lastpage
    708
  • Abstract
    We divide microprocessor testing into three distinct phases: verification of the control and data transfer functions; verification of the data-manipulation functions; and verification of the input-output functions. Here we deal in detail only with the first of these. To verify control, appropriate additional signals inside the chip are used and made observable at the terminal pins of the microprocessor chip. Complete instruction sequences, executed in a test mode, then serve to verify the control functions. Procedures for doing this are given and also for verifying data transfer functions.
  • Keywords
    Circuit testing; Data engineering; Integrated circuit interconnections; Logic design; Microprocessor chips; Pins; Read only memory; Signal design; Signal generators; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1983. 20th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0026-8
  • Type

    conf

  • DOI
    10.1109/DAC.1983.1585731
  • Filename
    1585731