DocumentCode :
3148127
Title :
Test Strategy for Microprocessers
Author :
Jain, Sunil K. ; Susskind, Alfred K.
Author_Institution :
Dept. of Electrical and Computer Engineering, Lehigh University, Bethlehem, PA
fYear :
1983
fDate :
27-29 June 1983
Firstpage :
703
Lastpage :
708
Abstract :
We divide microprocessor testing into three distinct phases: verification of the control and data transfer functions; verification of the data-manipulation functions; and verification of the input-output functions. Here we deal in detail only with the first of these. To verify control, appropriate additional signals inside the chip are used and made observable at the terminal pins of the microprocessor chip. Complete instruction sequences, executed in a test mode, then serve to verify the control functions. Procedures for doing this are given and also for verifying data transfer functions.
Keywords :
Circuit testing; Data engineering; Integrated circuit interconnections; Logic design; Microprocessor chips; Pins; Read only memory; Signal design; Signal generators; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1983. 20th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0026-8
Type :
conf
DOI :
10.1109/DAC.1983.1585731
Filename :
1585731
Link To Document :
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