DocumentCode
3148127
Title
Test Strategy for Microprocessers
Author
Jain, Sunil K. ; Susskind, Alfred K.
Author_Institution
Dept. of Electrical and Computer Engineering, Lehigh University, Bethlehem, PA
fYear
1983
fDate
27-29 June 1983
Firstpage
703
Lastpage
708
Abstract
We divide microprocessor testing into three distinct phases: verification of the control and data transfer functions; verification of the data-manipulation functions; and verification of the input-output functions. Here we deal in detail only with the first of these. To verify control, appropriate additional signals inside the chip are used and made observable at the terminal pins of the microprocessor chip. Complete instruction sequences, executed in a test mode, then serve to verify the control functions. Procedures for doing this are given and also for verifying data transfer functions.
Keywords
Circuit testing; Data engineering; Integrated circuit interconnections; Logic design; Microprocessor chips; Pins; Read only memory; Signal design; Signal generators; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1983. 20th Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0026-8
Type
conf
DOI
10.1109/DAC.1983.1585731
Filename
1585731
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