Title :
Total Stuck-at-Fault Testing by Circuit Transformation
Author :
LaPaugh, A.S. ; Lipton, Richard J.
Author_Institution :
Department of Electrical Engineering and Computer Science, Princeton University
Abstract :
We present a new approach to the production testing of VLSI circuits. By using very structured design for testability, we achieve 100% single stuck-at fault coverage with under 20 test vectors and no search. The approach also detects most multiple faults.
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Integrated circuit layout; Logic circuits; Logic testing; Pins; Wire;
Conference_Titel :
Design Automation, 1983. 20th Conference on
Print_ISBN :
0-8186-0026-8
DOI :
10.1109/DAC.1983.1585733
