Title :
Space Efficient Algorithms for VLSI Artwork Analysis
Author :
Szymanski, Thomas G. ; Van Wyk, Christopher J.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Abstract :
We present algorithms for performing connectivity analysis, transistor identification, and boolean geometric operations with region numbering. Previous methods all require O(n) space where n is the number of edges in the circuit artwork; our method takes only O(√n) space and can therefore handle circuits of any foreseeable size. Our algorithms are based on traditional scanline techniques in such a way that any implementation of our method will be at least as fast, as well as more compact. Statistics on one such implementation are presented.
Keywords :
Algorithm design and analysis; Circuits; Costs; Data structures; Geometry; Hardware; Performance analysis; Proposals; Statistics; Very large scale integration;
Conference_Titel :
Design Automation, 1983. 20th Conference on
Print_ISBN :
0-8186-0026-8
DOI :
10.1109/DAC.1983.1585739