Title :
The single event upset response of the Analog Devices, ADSP2100A, digital signal processor
Author :
Harboe-Sorensen, R. ; Seran, H. ; Armbruster, P. ; Adams, L.
Author_Institution :
European Space Agency/ESTEC, Noordwijk, Netherlands
Abstract :
The authors present the results of a radiation evaluation program carried out on the Analog Devices, ADSP2100A, which is a single chip microprocessor optimized for 12.5 Mips Digital Signal Processing (DSP). Single Event Upset/Latch-up (SEU/SEL) testing using Californium-252 was the primary aim of this program, however, accelerator heavy ion and proton SEU/SEL data as well as total ionising dose data are also presented. In order to perform these tests, in particular the SEU tests, a dedicated test system was required. Special test hardware and software were developed. The hardware design and software used are described and details of the various tests and test facilities are given. Finally, the authors report on the use of the SEU data for the calculation of expected in-orbit upset rates using the CREME suite of programs
Keywords :
aerospace instrumentation; digital signal processing chips; integrated circuit testing; ion beam effects; logic testing; proton effects; 12.5 MIPS; ADSP2100A; Analog Devices; CREME suite of programs; dedicated test system; digital signal processor; hardware design; heavy ion test data; in-orbit upset rates; latch up testing; proton test data; single chip microprocessor; single event upset response; software; total ionising dose data; Digital signal processing chips; Hardware; Ion accelerators; Life estimation; Microprocessors; Performance evaluation; Proton accelerators; Single event upset; Software testing; System testing;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213555
