• DocumentCode
    3148374
  • Title

    A method to select correct stimuli levels for S-functions behavioral model extraction

  • Author

    Myslinski, Maciej ; Verbeyst, Frans ; Vanden Bossche, Marc ; Schreurs, Dominique

  • Author_Institution
    Div. ESAT-Telemic, K.U. Leuven, Leuven, Belgium
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1170
  • Lastpage
    1173
  • Abstract
    S-functions and other frequency-domain behavioral models based on describing functions rely on the linearization of the response of a nonlinear RF or microwave component around a set of large-signal operating points. To assure the validity of the linearization principle, and thus the validity of the model, one has to select appropriate stimuli levels during the experiments which are performed to extract the model parameters. In this work we propose a formal procedure to identify the correct small-signal power levels using a system identification approach, i.e. taking the uncertainty of the measured data into account. The method is based on the analysis of the cost function of an errors-in-variables (EIV) estimator obtained for simple models.
  • Keywords
    frequency-domain analysis; high electron mobility transistors; microwave field effect transistors; network analysers; parameter estimation; semiconductor device measurement; S-function behavioral model extraction; cost function analysis; error-in-variable estimator; frequency-domain behavioral models; large-signal network analyzer; large-signal operating points; microwave component; nonlinear RF component; packaged pHEMT device; small-signal power levels; stimuli levels; system identification approach; Cost function; Data mining; Hafnium oxide; Measurement uncertainty; Microwave measurements; Power measurement; Power system modeling; Radio frequency; Signal processing; System identification; Describing functions; identification; microwave measurements; modeling; nonlinear systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517853
  • Filename
    5517853