• DocumentCode
    3148389
  • Title

    Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor

  • Author

    Velazco, R. ; Karoui, S. ; Chapuis, T. ; Benezech, D. ; Rosier, L.H.

  • Author_Institution
    Lab. de Genie Inf., LGI/IMAG, Grenoble, France
  • fYear
    1991
  • fDate
    9-12 Sep 1991
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    The authors present a set of techniques allowing them to perform heavy ion testing on 32-bit microprocessors. They study particularly how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as Cf252 fission-decay source equipment
  • Keywords
    aerospace instrumentation; integrated circuit testing; ion beam effects; microprocessor chips; 32 bit; 68020 microprocessor; 68882 coprocessor; Cf252 fission-decay source equipment; Motorola processors; heavy ion testing; upset cross-section; Circuit testing; Coprocessors; Digital systems; Linear particle accelerator; Microprocessors; Performance evaluation; Radiation detectors; Registers; Single event upset; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
  • Conference_Location
    La Grande-Motte
  • Print_ISBN
    0-7803-0208-7
  • Type

    conf

  • DOI
    10.1109/RADECS.1991.213557
  • Filename
    213557
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3148389