Title :
Heavy ion test results for the 68020 microprocessor and the 68882 coprocessor
Author :
Velazco, R. ; Karoui, S. ; Chapuis, T. ; Benezech, D. ; Rosier, L.H.
Author_Institution :
Lab. de Genie Inf., LGI/IMAG, Grenoble, France
Abstract :
The authors present a set of techniques allowing them to perform heavy ion testing on 32-bit microprocessors. They study particularly how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as Cf252 fission-decay source equipment
Keywords :
aerospace instrumentation; integrated circuit testing; ion beam effects; microprocessor chips; 32 bit; 68020 microprocessor; 68882 coprocessor; Cf252 fission-decay source equipment; Motorola processors; heavy ion testing; upset cross-section; Circuit testing; Coprocessors; Digital systems; Linear particle accelerator; Microprocessors; Performance evaluation; Radiation detectors; Registers; Single event upset; System testing;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213557
