On the surface roughness characterization for SAR data analysis

Author

Mattia, F. ; Souyris, J.C. ; Toan, T. Le ; Casarano, Domenico ; Posa, D. Casarano F ; Borgeaud, M.

Author_Institution

CNR, Matera, Italy

Volume

2

fYear

1997

fDate

3-8 Aug 1997

Firstpage

898

Abstract

The objective of this paper is to investigate the possibility of achieving a more realistic description of natural surfaces for microwave remote sensing purposes. By analyzing measured profiles, non-stationary effects which cannot be accounted for in the classical description of roughness are underlined. Subsequently, an expansion of 1/f processes in terms of wavelet orthonormal basis is used to derive a possible description of natural roughness

Keywords

electromagnetic wave scattering; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; synthetic aperture radar; SAR data analysis; geophysical measurement technique; land surface; microwave remote sensing; natural roughness; natural surface; nonstationary effects; radar remote sensing; radar scattering; realistic description; surface roughness characterization; synthetic aperture radar; terrain mapping; wavelet orthonormal basis; Autocorrelation; Data analysis; Europe; Lab-on-a-chip; Parameter estimation; Random processes; Remote sensing; Rough surfaces; Surface roughness; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Geoscience and Remote Sensing, 1997. IGARSS '97. Remote Sensing - A Scientific Vision for Sustainable Development., 1997 IEEE International

Print_ISBN

0-7803-3836-7

Type

conf

DOI

10.1109/IGARSS.1997.615291

Filename

615291