Title :
Radiation sensitivity of light emitting diodes (LED), laser diodes (LD) and photodiodes (PD)
Author :
Lischka, H. ; Henschel, H. ; Lennartz, W. ; Schmidt, H.U.
Author_Institution :
Fraunhofer-INT, Euskirchen, Germany
Abstract :
Commercially available diodes were irradiated at a flash X-ray source, a 60Co gamma ray source, and a 14 MeV neutron generator. During irradiation at the 60Co source the light output of the LEDs and LDs was measured continuously. From time to time the authors also observed their emission spectrum. With the PDs they measured the preamplifier output during 60Co irradiation as well as dark current and noise before and after irradiation. Determination of the sensitivity against neutrons was made off-line. After pulsed irradiation of PDs they measured how long a certain type of preamplifier was overdriven by the induced photocurrent
Keywords :
X-ray effects; gamma-ray effects; light emitting diodes; neutron effects; photodiodes; semiconductor device testing; semiconductor lasers; 1 MeV; 106 Gy; X-ray irradiation; dark current; emission spectrum; gamma-ray irradiation; induced photocurrent; laser diodes; light emitting diodes; light output; neutron irradiation; noise; photodiodes; preamplifier output; pulsed irradiation; radiation sensitivity; Dark current; Diode lasers; Light emitting diodes; Neutrons; Optical fiber couplers; Photodiodes; Power generation; Preamplifiers; Pulse measurements; Semiconductor diodes;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213565
