DocumentCode :
3148690
Title :
DC voltage interface standards for naval applications
Author :
Doerry, Norbert ; Amy, John
Author_Institution :
Naval Sea Syst. Command, United States Navy, Washington, DC, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
318
Lastpage :
325
Abstract :
MIL-STD-1399-300 and MIL-STD-1399-680 have established AC voltage interface requirements for U.S. naval surface ship electrical power systems. No such interface standards have been established for DC interfaces on U.S. naval surface ships. This paper provides recommendations for specific standard DC interface voltages for naval surface ship applications. These standard interface voltages are intended to facilitate the development and integration of DC loads. In recommending Interface Standards, the following were considered: · Existing commercial and military interface standards should be used to the maximum extent practical. · Different standard voltage levels should differ significantly (greater than 25%) · Higher voltages enable lower currents, and lighter cables. · Standard voltage ratings of available semiconductor devices and insulation ratings should be considered. In addition to nominal voltage levels, power quality requirements and conformance testing requirements are recommended.
Keywords :
conformance testing; insulation; load management; marine power systems; power semiconductor devices; power supply quality; AC voltage interface requirements; DC load development; DC load integration; DC voltage interface standards; MIL-STD-1399-300; MIL-STD-1399-680; U.S. naval surface ship electrical power systems; commercial interface standard; conformance testing requirements; insulation ratings; military interface standard; naval applications; nominal voltage levels; power quality requirements; semiconductor devices; standard voltage ratings; Military standards; Power system stability; Steady-state; Voltage control; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Ship Technologies Symposium (ESTS), 2015 IEEE
Conference_Location :
Alexandria, VA
Print_ISBN :
978-1-4799-1856-0
Type :
conf
DOI :
10.1109/ESTS.2015.7157912
Filename :
7157912
Link To Document :
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