DocumentCode
3148733
Title
A super-resolution method for low-quality face image through RBF-PLS regression and neighbor embedding
Author
Jiang, Junjun ; Hu, Ruimin ; Han, Zhen ; Lu, Tao ; Huang, Kebin
Author_Institution
Nat. Eng. Res. Center for Multimedia Software, Wuhan Univ., Wuhan, China
fYear
2012
fDate
25-30 March 2012
Firstpage
1253
Lastpage
1256
Abstract
In this paper, a new two-step method is proposed to infer a high-quality and high-resolution (HR) face image from a low-quality and low-resolution (LR) observation based on training samples in the database. First, a global face image is reconstructed based on the non-linear relationship between LR and HR face images, which is established according to radial basis function and partial least squares (RBF-PLS) regression. Based on the reconstructed global face patches manifold (formed by the image patches at the same position of all global face images), whose local geometry is more consistent with that of original HR face patches manifold than noisy LR one is, the Neighbor Embedding is applied to induce the target HR face image by preserving the similar local geometry between global face patches manifold and the original HR face patches manifold. A comparison of some state-of-the-art methods shows the superiority of our method, and experiments also demonstrate the effectiveness both under simulation and real conditions.
Keywords
image resolution; least squares approximations; radial basis function networks; regression analysis; HR face patches manifold; RBF-PLS regression; global face image; global face patches; image patches; image reconstruction; local geometry; neighbor embedding; nonlinear relationship; partial least squares; radial basis function; superresolution method; training samples; Face; Image reconstruction; Image resolution; Manifolds; Noise; Surveillance; Training; Face hallucination; Manifold learning; Neighbor Embedding; RBF-PLS; Super-resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location
Kyoto
ISSN
1520-6149
Print_ISBN
978-1-4673-0045-2
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2012.6288116
Filename
6288116
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