Title :
Imaging of leakages from elliptical microwave applicator
Abstract :
A new study in the field of microwave imaging techniques is presented. Leakages from an elliptical microwave applicator is the corner-stone of the study. The diffracted fields due to the treated material and elliptical aperture are processed to obtain an image of the applicator end terminal. Subsequently, an exact determination of the maximum leakage values is carried out. The results are displayed in the form of three dimensional surfaces representing the changes of the leakage field intensity as a function of the aperture geometry,. Working frequency is 2.45 GHz and the principles can be applied to any microwave frequency.
Keywords :
electromagnetic compatibility; image processing; microwave devices; microwave heating; microwave imaging; 2.45 GHz; EMC; aperture geometry; diffracted fields; digital image processing technique; elliptical microwave applicator; leakage field intensity; maximum leakage values; microwave imaging techniques; three dimensional surfaces; Additive noise; Antenna arrays; Apertures; Applicators; Electromagnetic diffraction; Geometry; Microwave antenna arrays; Microwave imaging; Microwave theory and techniques; Radio frequency;
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
DOI :
10.1109/ELMAGC.2002.1177469
