Title :
An Experimental MOS Fault Simulation Program CSASIM
Author :
Kawai, Masato ; Hayes, John P.
Author_Institution :
NEC Corporation, Tokyo, Japan
Abstract :
A prototype version of a new switch-level fault simulator for digital MOS IC´s is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.
Keywords :
Attenuators; Circuit faults; Circuit simulation; Computational modeling; Delay; National electric code; Resistors; Switching circuits; Virtual prototyping; Voltage;
Conference_Titel :
Design Automation, 1984. 21st Conference on
Print_ISBN :
0-8186-0542-1
DOI :
10.1109/DAC.1984.1585765