DocumentCode :
3148947
Title :
Workshop on fault diagnosis and tolerance in cryptography
Author :
Breveglieri, Luca ; Koren, Israel
Author_Institution :
University of Massachusetts
fYear :
2004
fDate :
June 28 2004-July 1 2004
Firstpage :
840
Lastpage :
840
Abstract :
Cryptographic devices are becoming increasingly ubiquitous and complex, making reliability an important design objective. Moreover, the diffusion of mobile, low-price consumer electronic equipment containing cryptographic components makes them more vulnerable to attack procedures, in particular to those based on injection of faults. This workshop aims at providing researchers in both the dependability and cryptography communities an opportunity to start bridging the gap between fault diagnosis and tolerance techniques, and cryptography.
Keywords :
Communities; Conferences; Elliptic curve cryptography; Fault diagnosis; Reliability theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks, 2004 International Conference on
Conference_Location :
Florence, Italy
Print_ISBN :
0-7695-2052-9
Type :
conf
DOI :
10.1109/DSN.2004.1311963
Filename :
1311963
Link To Document :
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