Title :
Workshop on fault diagnosis and tolerance in cryptography
Author :
Breveglieri, Luca ; Koren, Israel
Author_Institution :
University of Massachusetts
fDate :
June 28 2004-July 1 2004
Abstract :
Cryptographic devices are becoming increasingly ubiquitous and complex, making reliability an important design objective. Moreover, the diffusion of mobile, low-price consumer electronic equipment containing cryptographic components makes them more vulnerable to attack procedures, in particular to those based on injection of faults. This workshop aims at providing researchers in both the dependability and cryptography communities an opportunity to start bridging the gap between fault diagnosis and tolerance techniques, and cryptography.
Keywords :
Communities; Conferences; Elliptic curve cryptography; Fault diagnosis; Reliability theory;
Conference_Titel :
Dependable Systems and Networks, 2004 International Conference on
Conference_Location :
Florence, Italy
Print_ISBN :
0-7695-2052-9
DOI :
10.1109/DSN.2004.1311963