Title :
Heavy ion effects on SPOT satellites comparison between on-orbit observation and upset rate prediction
Author :
Chapuis, T. ; Ecoffet, R. ; Kerjean, L. ; Duzellier, S. ; Falguere, D. ; Rosier, L.H.
Author_Institution :
CNES, Toulouse, France
Abstract :
The authors describe the overall studies on SPOT1 and SPOT2 satellites, in order to assess the validity of upset rate prediction. Upset anomalies detected on OBC (On Board Computer) memory are dealt with. Heavy ion test results obtained during a recent campaign on the IPN Tandem accelerator are presented. The calculations done are summarized, pointing out the best choice of input parameters to achieve a realistic prediction. The goal is to improve the quality of event rate estimation, through a systematic collection of on-orbit anomalies related to charged particles
Keywords :
aerospace instrumentation; aerospace simulation; artificial satellites; cosmic ray effects and interactions; ion beam effects; proton effects; SPOT satellites; VLSI circuits; charged particles; heavy ion effects; input parameters; on-board computer; on-orbit anomalies; on-orbit observation; upset rate prediction; Capacity planning; Circuits; Earth; Ion accelerators; Life estimation; Memory architecture; Protection; Random access memory; Satellites; Testing;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213586
