Title :
The Scan Line Approach to Design Rules Checking: Computational Experiences
Author :
Chapman, P.T. ; Clark, K., Jr.
Author_Institution :
International Business Machines Corporation, IBM East Fishkill Facility, Hopewell Junction, NY
Abstract :
Advances in integrated circuit technology in the last several years have led to designs with ever-increasing complexity and density. Consequently, designers have been faced with performing design-rule-checking on designs with shape outlines that have been doubling in number every year or two. In response, we have recently incorporated efficient algorithms into our design checking strategy. This paper reports on the computational results of these efforts.
Keywords :
Algorithm design and analysis; Buildings; Chemical elements; Design for experiments; Explosions; Integrated circuit technology; Optical design; Physics computing; Shape; Very large scale integration;
Conference_Titel :
Design Automation, 1984. 21st Conference on
Print_ISBN :
0-8186-0542-1
DOI :
10.1109/DAC.1984.1585801