Title :
A fully integrated CMOS RF power amplifier with tunable matching network for GSM/EDGE dual-mode application
Author :
Kim, Hyungwook ; Yoon, Youngchang ; Lee, Ockgoo ; An, Kyu Hwan ; Lee, Dong Ho ; Kim, Woonyun ; Lee, Chang-Hoo ; Laskar, Joy
Author_Institution :
Georgia Electron. Design Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A fully integrated power amplifier operating at switching and linear mode is implemented using 0.18-μm CMOS technology. To maximize performance for both operation modes, the fundamental load impedances are optimized with a variable capacitor for GSM and EDGE application. For GSM application, 32 dBm of the output power with 45 % of the drain efficiency is achieved at 1.76 GHz. With EDGE modulation signal at 1.76 GHz, error vector magnitude (EVM) has an RMS value of less than 5 % up to 27.5 dBm of the output power, and 28.1 % of modulated PAE is achieved at this power. The output spectrum is confined within the inside of mask up to 27.5 dBm of the output power.
Keywords :
3G mobile communication; CMOS analogue integrated circuits; UHF power amplifiers; capacitors; cellular radio; EDGE modulation signal; EVM; GSM-EDGE dual-mode application; PAE; efficiency 28.1 percent; error vector magnitude; frequency 1.76 GHz; fully-integrated CMOS RF power amplifier; linear mode; matching network; size 0.18 mum; switching mode; variable capacitor; CMOS technology; Capacitors; GSM; Impedance matching; Linearity; Network-on-a-chip; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers; linear PA; power amplifiers; power combining; switching PA; variable capacitor;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5517920