Title :
EEG analysis based on wavelet-spectral entropy for epileptic seizures detection
Author :
Mirzaei, Ahmad ; Ayatollahi, Ahmad ; Gifani, Parisa ; Salehi, Leili
Author_Institution :
Dept. of Electr. Eng., Iran Univ. of Sci. & Technol., Tehran, Iran
Abstract :
The electroencephalogram (EEG) is the brain signal containing valuable information about the normal or epileptic state of the brain. In this paper a discrete wavelet-spectral entropy (SEN) method is presented for epileptic seizures detection through the analysis of EEGs and EEG sub-bands. The EEG signal is decomposed by discrete wavelet transform into its sub-bands and is characterized by spectral entropy approach. This method is applied to three different groups of EEG signals: 1) healthy states, 2) epileptic states during a seizure-free interval (interictal EEG), 3) epileptic states during a seizure (ictal EEG). Spectral entropy differentiates between these three states and their sub-bands. At the end, t-student statistical distribution is applied to determine the measure of distinguishing between different subjects. This method can discriminate between ictal and healthy subject of alpha sub-band (8-15 Hz) with 98.5% p-value.
Keywords :
electroencephalography; entropy; medical signal detection; medical signal processing; wavelet transforms; EEG analysis; EEG signals; EEG subbands; alpha subband; brain signal; discrete wavelet transform; epileptic seizure detection; epileptic states; frequency 8 Hz to 15 Hz; healthy subject; interictal EEG; seizure-free interval; spectral entropy; t-student statistical distribution; wavelet-spectral entropy; Discrete wavelet transforms; Electroencephalography; Entropy; Epilepsy; Signal resolution; Wavelet analysis; Discrete Wavelet Transform (DWT); Electroencephalogram (EEG); Epilepsy; component; spectral entropy; t-student statistical distribution;
Conference_Titel :
Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6495-1
DOI :
10.1109/BMEI.2010.5639894