Title : 
The effects of irradiation on heteroepitaxial InP/InGaAs solar cells
         
        
            Author : 
Karlina, L.B. ; Vozlovskii, V.V. ; Solov´ev, V.A. ; Shvarts, M.Z.
         
        
            Author_Institution : 
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
         
        
        
        
        
        
            Abstract : 
Great interest in InGaAs solar cells is due to the possibility of their use as the bottom cells in high-efficiency mechanically stacked concentrator tandem solar cells and as the bottom cell for monolithic tandem solar cells. Using lightly doped material of n photoactive layers (n-p polarity) and a moderately doped p-layer allows an increase in the radiation resistance of these solar cells. The optimum design for a radiation resistant InGaAs solar cell seems to be a 0.8-1.2 μm thick emitter with a dopant concentration of (0.8-1)·1017 cm -3. The subject of this paper is experimental results obtained from studying the effect of 1 MeV electron, 3 and 10 MeV proton irradiation in InP/InGaAs solar cells
         
        
            Keywords : 
III-V semiconductors; electron beam effects; epitaxial growth; gallium arsenide; indium compounds; p-n heterojunctions; proton effects; semiconductor device testing; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; solar cells; 0.8 to 1.2 mum; 1 MeV; 3 to 10 MeV; InP-InGaAs; dopant concentration; heteroepitaxial InP/InGaAs solar cells; irradiation effects tests; lightly doped material; mechanically stacked concentrator tandem solar cells; monolithic tandem solar cells; optimum design; photoactive layers; radiation resistance; Circuits; Degradation; Electrical resistance measurement; Electrons; Indium gallium arsenide; Indium phosphide; Photovoltaic cells; Substrates; Sun; Voltage;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
         
        
            Conference_Location : 
Washington, DC
         
        
        
            Print_ISBN : 
0-7803-3166-4
         
        
        
            DOI : 
10.1109/PVSC.1996.563991