• DocumentCode
    3150583
  • Title

    Angle of incidence corrections for GaAs/Ge solar cells with low absorptance coverglass

  • Author

    Burger, Dale R. ; Mueller, Robert L. ; Goodelle, George ; Powe, Joseph ; Schwartz, Joel

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    243
  • Lastpage
    246
  • Abstract
    A total of four different types of coverglass/filter combinations were tested over a 0 to 85 degree angle of incidence range. One group of cells was irradiated to provide additional data. A predicted cell response was calculated using the cosine and Fresnel corrections. A comparison of measured versus predicted values showed a good fit for blue reflection or anti-reflection (AR) filters. Both blue-red and infrared reflection filtered cells showed decreased output in the 40 to 80 degree range due to movement of filter IR band-edge into cell response range. Performance at very high incidence angles is still not fully understood. A special infrared filter was used which did not have an angle of incidence effect. Irradiation of cells improved angle of incidence performance for cells with infrared reflection filters
  • Keywords
    III-V semiconductors; aerospace simulation; elemental semiconductors; gallium arsenide; germanium; optical filters; photovoltaic power systems; semiconductor device models; solar cells; space vehicle power plants; Fresnel correction; GaAs-Ge; GaAs-Ge solar cells; angle of incidence corrections; anti-reflection filter; blue reflection filter; cell response prediction; cosine correction; coverglass; incidence angle; incidence performance; infrared reflection filter; space power; Fresnel reflection; Gallium arsenide; Laboratories; Optical filters; Optical reflection; Optical refraction; Optical surface waves; Photovoltaic cells; Space technology; Space vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.563992
  • Filename
    563992