Title :
Market mechanism for transmission reliability
Author :
Monroy, Jose Joaquin Ruiz ; Kita, Hiroyuki ; Tanaka, Eiichi ; Hasegawa, Jun
Author_Institution :
Dept. of Electr. Eng., Hokkaido Univ., Sapporo, Japan
Abstract :
This paper proposes a mechanism for transmission reliability considering line congestion, real power losses and MVA line flows for each bilateral transaction in a deregulated market environment. Transaction reliability is evaluated by means of a series of power flows used to determine the contribution that each transaction makes to the system and applying penalties to the transactions that violate system´s constraints. A day ahead load forecast is used to create a bilateral transactions matrix (BTM) by means of an algorithm developed by the authors which is used as the transactions schedule for WIST, an application software for power system analysis; then penalties based on contracts arc calculated. This process constitutes the market mechanism proposed in this paper and is helpful for the independent system operator (ISO) to understand the effects of bilateral transactions and create rules for a reliable transmission system operation that benefits all participants in the electricity market.
Keywords :
load flow; losses; power markets; power system analysis computing; power transmission reliability; MVA line flows; bilateral transaction; bilateral transactions; bilateral transactions matrix; day ahead load forecast; deregulated market environment; electricity market; independent system operator; line congestion; market mechanism; power flow control; power system analysis software; real power losses; reliable transmission system operation; transactions schedule; transmission reliability; Algorithm design and analysis; Application software; Load flow; Load forecasting; Power system analysis computing; Power system reliability; Power systems; Propagation losses; Scheduling algorithm; Software algorithms;
Conference_Titel :
Transmission and Distribution Conference and Exhibition 2002: Asia Pacific. IEEE/PES
Print_ISBN :
0-7803-7525-4
DOI :
10.1109/TDC.2002.1177589