A full-wave model for the analysis of the high-frequency behavior of open interconnect structures

Author

Falco, Salvatore ; Miano, Giavanni ; Verolino, Luigi ; Maffucci, Antonio ; Villone, Fabio

Author_Institution

DIEL, Napoli Universita "Federico II"

Volume

1

fYear

2003

fDate

16-16 May 2003

Firstpage

292

Abstract

This paper presents a full-wave model for the analysis of a lossless two-conductor interconnect. This model accounts for high-frequency effects, like distortion and radiation, that arise because the structure is open and of finite length, and that cannot be predicted by the standard transmission line (STL) model. This enhanced transmission line model (ETL) consists of a mixed system of differential and integral equations, whose kernel shows the logarithmic singularity typical of the surface distributions. The problem has been solved by using two different procedures: one based on the collocation method, the other on a dual formulation in the spectral domain

Keywords

interconnections; spectral-domain analysis; transmission line theory; collocation method; differential equations; enhanced transmission line model; full-wave model; high-frequency behavior; integral equations; logarithmic singularity; lossless two-conductor interconnect; open interconnect structures; spectral domain dual formulation; Conductors; Dispersion; Distributed parameter circuits; Electronic mail; Integral equations; Integrated circuit interconnections; Kernel; Power transmission lines; Predictive models; Propagation losses;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on

Conference_Location

Istanbul

Print_ISBN

0-7803-7779-6

Type

conf

DOI

10.1109/ICSMC2.2003.1428248

Filename

1428248