Title :
Surviving state disruptions caused by test: A case study
Author :
Parker, Kenneth P. ; Kameyama, Shuichi ; Dubberke, David
Author_Institution :
Agilent Technol. Inc., Loveland, CO, USA
Abstract :
The practice of initializing a board or system for testing purposes is not an exact science, but rather, pursued empirically and with an increasing risk of undesired side effects. It has been suspected that Boundary-Scan testing can cause such side effects. This paper provides a case study of such a board where a detailed root-cause analysis was performed. Some issues are identified that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing and to leave it in a safe state upon completion of testing.
Keywords :
IEEE standards; boundary scan testing; IEEE 1149.1; board; boundary-scan testing; root-cause analysis; side effects; Flip-flops; Integrated circuits; Pins; Registers; Regulators; Testing; Voltage control;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139140
