DocumentCode :
3151951
Title :
PROTEST: A Tool for Probabilistic Testability Analysis
Author :
Wunderlich, Hans-Joachim
Author_Institution :
Universitat Karlsruhe Institut fur Informatik IV, Karlsruhe, Federal Republic of Germany
fYear :
1985
fDate :
23-26 June 1985
Firstpage :
204
Lastpage :
211
Abstract :
The CAD-tool PROTEST (Probabilistic Testability Analysis) is presented. PROTEST estimates for each fault of a combinational circuit its detection probability which can be used as a testability measure. Moreover it calculates the number of random test patterns which must be generated in order to achieve the required fault coverage. It is also demonstrated that the fault coverage will increase and the necessary number of random patterns will drastically decrease, if each primary input is stimulated by test patterns having specific probabilities of being logical "1". PROTEST uses this fact and determines for each input the optimal signal probability for a randomly generated pattern.
Keywords :
Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Logic testing; Signal generators; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1985. 22nd Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0635-5
Type :
conf
DOI :
10.1109/DAC.1985.1585936
Filename :
1585936
Link To Document :
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