Title :
PATEGE: An Automatic DC Parametric Test Generation System for Series Gated ECL Circuits
Author :
Ogihara, Takuji ; Saruyama, Shuichi ; Murai, Shinichi
Author_Institution :
Mitsubishi Electric Corporation, Kamakura, Japan
Abstract :
For ECL circuits, DC parametric tests such as input current (IIL, IIH), reference voltage (VBB), and power supply current (ICC) tests are executed as well as functional tests. This paper describes an automatic DC parametric test generation system PATEGE for the series gated ECL circuits. PATEGE can automatically generate the test patterns and calculate the expected values for IIL, IIH, VBB and ICC tests.
Keywords :
Automatic test pattern generation; Automatic testing; Circuit testing; Current supplies; DC generators; Logic testing; Switches; System testing; Test pattern generators; Voltage;
Conference_Titel :
Design Automation, 1985. 22nd Conference on
Print_ISBN :
0-8186-0635-5
DOI :
10.1109/DAC.1985.1585937
