• DocumentCode
    3152225
  • Title

    Temporally resolved impedance measurement of differential, RF-powered devices using the example of a μwave RFID front-end

  • Author

    Bansleben, Christian ; Kuhn, Silvio ; Gay, Nicolas ; Fischer, Wolf-Joachim

  • Author_Institution
    Fraunhofer Inst. for Photonic Microsyst. (IPMS), Dresden, Germany
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    852
  • Lastpage
    855
  • Abstract
    This work was motivated by the idea to monitor the input impedance of differential front-ends of passive RFID-transponders depending on their power-consumption. Different methods readily available in state-of-the-art network analyzers are compared with regard to the special demands imposed by passive RFID front-ends. At this the correct stimulation of the DUT appears to be the major issue of conventional methods. Hereupon a new approach is proposed which for the first time combines the proper stimulation of differential, RF-powered devices with the data aquisition of differential mixed-mode S-parameters in temporal resolution. The new measurement method is applied to a 2.45 GHz RFID transponder showing detailed mixed-mode results of its power-up behavior.
  • Keywords
    data acquisition; electric impedance measurement; network analysers; radiofrequency identification; transponders; μwave RFID front-end; data acquisition; differential RF-powered devices; differential mixed-mode S-parameters; frequency 2.45 GHz; network analyzers; passive RFID-transponders; power-consumption; temporally resolved impedance measurement; Impedance measurement; Integrated circuit measurements; Microwave measurements; Passive RFID tags; Radio frequency; Radiofrequency identification; Rectifiers; Scattering parameters; Signal resolution; Transponders; Scattering parameters measurement; differential analyzers; integrated circuit testing; microwave measurement; multiport circuits; network testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5518044
  • Filename
    5518044