DocumentCode :
3152357
Title :
Resistance Calculation from Mask Artwork Data by Finite Element Method
Author :
Barke, Erich
Author_Institution :
Department of Electrical Engineering, University of Hannover, Germany FR
fYear :
1985
fDate :
23-26 June 1985
Firstpage :
305
Lastpage :
311
Abstract :
Traditional methods for resistance calculation suffer from some unfavourable features, that make them uncomfortable to use. Although requiring a lot of manual processing, they are rather inaccurate and often claim for severe artwork restrictions (e.g. orthogonal geometry) which conflict with the desire for most dense layouts. This paper describes a resistance calculation program called REX (Resistance Extractor), which is based on the well-known Finite Element Method (FEM). Highly flexible in use, it is able to process designed and parasitic resistors of any shape and material with adjustable precision. REX is part of the layout verification system ALAS, designed for mask artwork analysis of bipolar circuits.
Keywords :
Circuit analysis; Conductivity; Contact resistance; Electric resistance; Finite element methods; Geometry; Integrated circuit layout; Ion implantation; Resistors; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1985. 22nd Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0635-5
Type :
conf
DOI :
10.1109/DAC.1985.1585957
Filename :
1585957
Link To Document :
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