• DocumentCode
    3152445
  • Title

    Invited address

  • fYear
    2011
  • fDate
    20-22 Sept. 2011
  • Firstpage
    14
  • Lastpage
    14
  • Abstract
    Provides an abstract of the invited presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2011 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4577-0153-5
  • Type

    conf

  • DOI
    10.1109/TEST.2011.6139188
  • Filename
    6139188