• DocumentCode
    3152550
  • Title

    Impact of radiated EMI in high frequency crystal oscillator

  • Author

    Rohde, Ulrich L. ; Poddar, Ajay K.

  • Author_Institution
    University of Cottbus, Germany
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The high frequency (HF) crystal oscillator is susceptible to electromagnetic interference (EMI), which affects the stability or accuracy of reference frequency standards. The effect of radiated EMI can be both deterministic and random in nature that shows up as jitter in the time domain and phase noise in the frequency domain. In this paper, we studied the impact of radiated EMI in 155.6 MHz crystal oscillator (XO) and the design consideration for EMI and jitter insensitive signal sources for reference frequency standard applications. Experimental results and CAD simulated data provides insight into observed characteristics (mode-jumping, sub-harmonics and jitter, and validated with the design example of 155.6 MHz crystal oscillator circuits. Although, the likelihood of frequency shift in a noisy electromagnetic environment is far higher, however, this paper reports the mode-coupled phase-injected techniques to restrict the frequency shift and also minimizes the phase noise by 8–10 dB.
  • Keywords
    Circuit simulation; Design automation; Electromagnetic interference; Frequency domain analysis; Hafnium; Jitter; Oscillators; Phase noise; Signal design; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5518061
  • Filename
    5518061