DocumentCode
3152550
Title
Impact of radiated EMI in high frequency crystal oscillator
Author
Rohde, Ulrich L. ; Poddar, Ajay K.
Author_Institution
University of Cottbus, Germany
fYear
2010
fDate
23-28 May 2010
Firstpage
1
Lastpage
1
Abstract
The high frequency (HF) crystal oscillator is susceptible to electromagnetic interference (EMI), which affects the stability or accuracy of reference frequency standards. The effect of radiated EMI can be both deterministic and random in nature that shows up as jitter in the time domain and phase noise in the frequency domain. In this paper, we studied the impact of radiated EMI in 155.6 MHz crystal oscillator (XO) and the design consideration for EMI and jitter insensitive signal sources for reference frequency standard applications. Experimental results and CAD simulated data provides insight into observed characteristics (mode-jumping, sub-harmonics and jitter, and validated with the design example of 155.6 MHz crystal oscillator circuits. Although, the likelihood of frequency shift in a noisy electromagnetic environment is far higher, however, this paper reports the mode-coupled phase-injected techniques to restrict the frequency shift and also minimizes the phase noise by 8–10 dB.
Keywords
Circuit simulation; Design automation; Electromagnetic interference; Frequency domain analysis; Hafnium; Jitter; Oscillators; Phase noise; Signal design; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5518061
Filename
5518061
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