DocumentCode :
3152612
Title :
An RF-MEMS switch with mN contact forces
Author :
Patel, C.D. ; Rebeiz, Gabriel M.
Author_Institution :
University of California San Diego, La Jolla, United States
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
This paper presents a new RF MEMS switch design which is capable of generating large forces under electrostatic actuation. The switch is 155×130 um^2, and results in 0.8–1.8 mN of contact force at 80–100 V, with a release force of 0.75 mN. The design is also highly insensitive to biaxial stress and to stress gradients. A prototype switch, fabricated on a high resistivity silicon substrates using an 8 um-thick gold cantilever, results in pull-in voltage of 62 V, a switching time of 6 us, and an upstate capacitance of 24 fF. The contact metal is Au-Ru and the measured switch resistance dropped from 250 to 1.2 ohms for Vact = 60 – 100 V, showing the large contact-force operation of the switch. Measurements versus temperature show excellent stability from 25 – 105 C.
Keywords :
Conductivity; Contacts; Electrical resistance measurement; Electrostatic actuators; Prototypes; Radiofrequency microelectromechanical systems; Silicon; Stress; Switches; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5518064
Filename :
5518064
Link To Document :
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