Title :
The susceptibility of the microprocessor-based relay of high voltage substations to EMP
Author :
Zezhong, Wang ; Binxian, Lu ; Chengrong, Li ; Baoming, Xiao ; Cheng, Huang
Author_Institution :
North China Electr. Power Univ., Beijing
Abstract :
Based on the transient electric field measurement in the 500 kV substations, the authors measured the EMP susceptibility of a set of microprocessor-based protection relay of high voltage substations to electromagnetic field pulse (EMP). The results of measurement show that the field suppression effect of shielding box of protection relay and the ability of relay to resist interference like as EMP are enough to be compatible in the maximal transient switching electric field in substations
Keywords :
electric variables measurement; electromagnetic interference; electromagnetic pulse; electromagnetic shielding; high-voltage engineering; microprocessor chips; relay protection; substation protection; 500 kV; EMP susceptibility; electromagnetic field pulse; field suppression effect; high voltage substations; interference resistance; maximal transient switching electric field; microprocessor-based protection relay; power substations; shielding box; transient electric field measurement; EMP radiation effects; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic transients; Protective relaying; Pulse measurements; Relays; Substation protection; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1428306
