Title :
An Analysis of Temperature Impact on MOSFET Mismatch
Author :
Mennillo, S. ; Spessot, A. ; Vendrame, L. ; Bortesi, L.
Author_Institution :
R&D - Technol. Dev., Agrate Brianza
fDate :
March 30 2009-April 2 2009
Abstract :
Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matching properties with temperature, suggesting a possible physical explanation to this phenomenon and proposing a BSIM3 model implementation for Monte Carlo mismatch simulations.
Keywords :
MOSFET; Monte Carlo methods; semiconductor device models; thermal analysis; BSIM3 model implementation; MOSFET mismatch; Monte Carlo mismatch simulation; current gain matching property; temperature impact analysis; Analytical models; Current measurement; Gain measurement; Geometry; MOSFET circuits; Measurement techniques; Monte Carlo methods; Particle measurements; Temperature distribution; Testing;
Conference_Titel :
Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on
Conference_Location :
Oxnard, CA
Print_ISBN :
978-1-4244-4259-1
DOI :
10.1109/ICMTS.2009.4814610
