• DocumentCode
    3152906
  • Title

    Effects of power bus stitching on signal integrity and thermal analysis

  • Author

    Ricchiuti, V. ; Illuminati, P. ; Orlandi, A. ; Antonini, G.

  • Author_Institution
    CNX S.p.A., L´´Aquila
  • Volume
    1
  • fYear
    2003
  • fDate
    16-16 May 2003
  • Firstpage
    539
  • Abstract
    Ferrite beads and gaps are commonly used to isolate simultaneous switching noise produced on the power/ground planes of the modern digital boards by the switching of complex integrated circuits. The work presented in this paper studies the effectiveness of these components in mitigating the propagation of the high-frequency noise on DC power buses of a very complex multilayer high speed digital board. Two different types of ground plane layouts are compared: single point and multipoint ground layer stitching. S21 measurements on bare boards and eye diagram measurements on full functioning boards show a better degree of isolation in the case of multipoint ground plane stitching. The signal integrity analysis is integrated with a thermal analysis, conducted with infrared thermographies executed on the test boards. Three points are explained in details: 1) plane segmentation improves noise separation; 2) multipoint stitching improves thermal dissipation; 3) power plane segmentation together with ground plane stitching is a good compromise between electrical and thermal demands
  • Keywords
    electromagnetic interference; infrared imaging; integrated circuit interconnections; printed circuit design; printed circuit testing; switching circuits; thermal analysis; DC power buses; S21 measurements; bare boards; digital boards; eye diagram measurements; ferrite beads; gaps; ground layer stitching; ground plane layouts; ground plane stitching; infrared termography; integrated circuits; noise separation; power bus stitching; power plane segmentation; power/ground planes; signal integrity analysis; switching noise; thermal analysis; thermal dissipation; Electromagnetic interference; Ferrites; Integrated circuit noise; Integrated circuit technology; Nonhomogeneous media; Radio frequency; Signal analysis; Surface-mount technology; Switching circuits; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
  • Conference_Location
    Istanbul
  • Print_ISBN
    0-7803-7779-6
  • Type

    conf

  • DOI
    10.1109/ICSMC2.2003.1428313
  • Filename
    1428313