Title :
The influence of defects on the emission spectra of high power laser diodes
Author :
Bream, P.J. ; Bull, S. ; Xia, R. ; Andrianov, A.Y. ; Harrison, I. ; Larkins, E.C.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nottingham Univ., UK
Abstract :
This paper gives the electroluminescence (EL) spectra analysis of high power laser bars (diodes) by simple semianalytic models in addition to the fast Fourier transform to simulate laser cavities with multiple defects. These models, based on plane-wave propagation and normal incidence boundary conditions, allow the defect positions to be determined and the estimation of their reflectivities and losses.
Keywords :
electroluminescence; fast Fourier transforms; laser cavity resonators; optical losses; reflectivity; semiconductor lasers; spectral analysis; EL spectra analysis; electroluminescence; emission spectra; fast Fourier transform; high power laser diode; incidence boundary condition; laser cavity; losses; multiple defect; plane-wave propagation; reflectivity; semianalytic model; Analytical models; Bars; Boundary conditions; Diode lasers; Electroluminescence; Fast Fourier transforms; Laser modes; Optical propagation; Power lasers; Reflectivity;
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
DOI :
10.1109/CLEOE.2003.1312238
