DocumentCode
3153193
Title
Measurement of the Wigner distribution of a tapered semiconductor laser
Author
Neubert, B. ; Scharfe, W.-D. ; Huber, G.
Author_Institution
Rofin-Sinar Laser GmbH, Hamburg, Germany
fYear
2003
fDate
22-27 June 2003
Firstpage
190
Abstract
The aim of the paper is to characterize these lasers by measuring it´s Wigner distribution and thus obtaining phase and coherence information. Tapered semiconductor lasers exceed ordinary semiconductor lasers in brightness due to an improved lateral structure. Moving slit technology is used to obtain one dimensional intensity distributions of an external caustic of the laser beam. The blurring of the distribution away from the center can be attributed to beam aberrations.
Keywords
Wigner distribution; aberrations; brightness; laser beams; light coherence; semiconductor lasers; Wigner distribution; beam aberration; blurring; brightness; coherence information; laser beam; moving slit technology; one dimensional intensity distribution; phase information; tapered semiconductor laser; Attenuation measurement; Brightness; Cameras; Collimators; Coordinate measuring machines; Laser beams; Optical attenuators; Optical propagation; Phase measurement; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN
0-7803-7734-6
Type
conf
DOI
10.1109/CLEOE.2003.1312251
Filename
1312251
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