DocumentCode
3153242
Title
[Breaker page]
fYear
2009
fDate
March 30 2009-April 2 2009
Firstpage
189
Lastpage
189
Abstract
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on
Conference_Location
Oxnard, CA
Print_ISBN
978-1-4244-4259-1
Type
conf
DOI
10.1109/ICMTS.2009.4814638
Filename
4814638
Link To Document