DocumentCode :
3153425
Title :
Analytical theory for the relative intensity noise of multitransverse mode vertical-cavity surface-emitting lasers: influence of spatial effects
Author :
Valle, Angel ; Pesquera, Luis
Author_Institution :
CSIC, Univ.de Cantabria, Santander, Spain
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
200
Abstract :
In this paper we obtain analytical expressions for the RIN of multimode VCSELs. These expressions take into account spatial effects since transverse mode and carrier density profiles are incorporated in our analysis. We show that two resonance peaks appear in the noise spectra of the individual modes and total power of a two-mode VCSEL. We analytically show that these peaks appear at frequencies that correspond to the relaxation oscillation frequencies of the multimode laser.
Keywords :
carrier density; laser modes; optical noise; relaxation oscillators; semiconductor device models; semiconductor lasers; surface emitting lasers; carrier density profile; multimode laser; multitransverse mode vertical-cavity surface-emitting laser; noise spectra; relative intensity noise; relaxation oscillation frequency; resonance peak; spatial effect; transverse mode; Charge carrier density; Equations; Frequency; Laser modes; Laser noise; Laser theory; Optical filters; Stochastic processes; Surface emitting lasers; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
Type :
conf
DOI :
10.1109/CLEOE.2003.1312261
Filename :
1312261
Link To Document :
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